专利名称：3D-SHAPE MEASUREMENT DEVICE, 3D-SHAPE MEASUREMENT METHOD, AND 3D-SHAPE MEASUREMENT PROGRAM
发明人：UNTEN Hiroki,ISHII Tatsuya申请号：EP14860750.0申请日：20140916公开号：EP3067658B1公开日：20191002
摘要：A three-dimensional shape measurement apparatus is provided with an imagingunit that successively outputs captured predetermined two-dimensional images; amemory unit that stores the two-dimensional images outputted by the imaging unit; athree-dimensional shape model generation unit that generates three-dimensional shapemodel, based on the predetermined two-dimensional images and stores the generatedthree-dimensional shape model in the memory unit; a region calculation unit that
calculates, based on the two-dimensional images and the three-dimensional shape modelstored in the memory unit, a measurement-completed region in the two-dimensionalimages; and a display image generation unit that generates, based on the measurement-completed region, a display image from the two-dimensional images.
申请人：Toppan Printing Co., Ltd.
代理机构：Cabinet Plasseraud
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