专利名称：EDDY CURRENT INSPECTION METHOD发明人：Ui Won Suh,Clifford Sneed申请号：US10355810申请日：20030130
公开号：US20040153260A1公开日：20040805
专利附图：
摘要：A specimen is mounted in a multiaxis machine. An eddy current probe is alsomounted in the machine for multiaxis movement relative to the specimen. The probe isaligned in situ with a target in the specimen by direct contact therebetween at multiplealignment sites corresponding with a numerical model of the specimen. Eddy current
inspection of the target may then be conducted by moving the probe along multipleinspection sites of the target corresponding with the specimen model.
申请人：SUH UI WON,SNEED CLIFFORD
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